• DocumentCode
    2515087
  • Title

    Using Gene Pair Combinations to Improve the Accuracy of the PAM Classifier

  • Author

    Chopra, Pankaj ; Kang, Jaewoo ; Lee, Jinseung

  • Author_Institution
    Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
  • fYear
    2009
  • fDate
    1-4 Nov. 2009
  • Firstpage
    174
  • Lastpage
    177
  • Abstract
    Various classification methods have been used to predict the class of tissue samples based on gene expression data. prediction analysis for microarrays (PAM) is one of the top classifiers that has been extensively used for cancer classification. In this paper a novel method of combining expression data from gene pairs is used to improve the overall accuracy of PAM. Recent studies suggest that deregulation of pathways, rather than individual genes, may be critical in triggering carcinogenesis. The pathway deregulation is often caused by the simultaneous deregulation of more than one genes in the pathway. Robust gene pair combinations may exploit these underlying bio-molecular reactions to provide better biomarkers for cancer, as compared to single genes. In this work, we used gene pair combinations, called doublets, to improve the accuracy of PAM. We validated the proposed approach with nine cancer datasets. The accuracy of PAM, using these doublets, increased consistently across these datasets, in some cases with a significant margin (13%).
  • Keywords
    cancer; genetics; medical diagnostic computing; molecular biophysics; statistical analysis; PAM classifier; biomolecular reactions; cancer classification; carcinogenesis; gene expression; gene pair combinations; microarrays; prediction analysis; Bioinformatics; Biomedical engineering; Cancer; Computer science; Data analysis; Data engineering; Gene expression; Robustness; Support vector machine classification; Support vector machines; PAM; cancer classification; doublets; gene pairs; microarray;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedicine, 2009. BIBM '09. IEEE International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-0-7695-3885-3
  • Type

    conf

  • DOI
    10.1109/BIBM.2009.47
  • Filename
    5341823