A mathematical model for estimating acceptable ratio of test patterns

Author

Janfaza, Vahid ; Foroutan, Paniz ; Forouzandeh, Bahjat ; Haghbayan, M.H.

Author_Institution

Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran

fYear

2014

fDate

26-29 Sept. 2014

Firstpage

1

Lastpage

4

Abstract

Sequential circuit testing has been recognized as one of the most difficult problems in the area of fault detection. Controllability and observability of a sequential circuit is low because of their internal states. Therefore finding suitable sequence of test patterns is becoming increasingly complex. We have proposed a method to estimate an expectation graph by utilizing a mathematical model which exploits probabilistic 4-value system. The expectation graph is used to determine the minimum number of faults detected by a suitable sequence of test patterns. Experimental results show our mathematical model has reduced number of test patterns in specified fault coverage.

Keywords

automatic test pattern generation; circuit testing; fault diagnosis; graph theory; probability; sequential circuits; expectation graph; fault detection; probabilistic 4-value system; sequential circuit testing; test patterns acceptable ratio; Circuit faults; Fault detection; Logic gates; Mathematical model; Probabilistic logic; Sequential circuits; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Design & Test Symposium (EWDTS), 2014 East-West

Conference_Location

Kiev

Type

conf

DOI

10.1109/EWDTS.2014.7027041

Filename

7027041