Improving military readiness and U.S. competitiveness through dual use design and test technology

Author

Dearborn, William R. ; Anderson, Diana ; Barkley, Jeffrey

Author_Institution

Loral Federal Systs., Owego, NY, USA

fYear

1994

fDate

20-22 Sep 1994

Firstpage

495

Lastpage

501

Abstract

This paper describes the methodology and tools being developed under the Virtual Test (VTest) Program sponsored by Wright Laboratory´s, Manufacturing Technology Directorate. The VTest system will be a commercially available, test system independent, Integrated Process/Product Development (IP/PD) solution for the design and virtual testing of electronic circuits. The methodology and tools developed under the VTest program will provide measurable benefits to enterprises who have spread the printed circuit assembly (PCA) and line replaceable module (LRM) life-cycle across more than one location or test system, electrical design and manufacturing companies and electrical service depots

Keywords

CAD; automatic test equipment; electronic equipment testing; military equipment; product development; virtual machines; Air Force; US competitiveness; VTest system; Wright Laboratory; design for test; dual use design; electrical design; electrical service depots; integrated process/product development; life-cycle; line replaceable module; military readiness; printed circuit assembly; virtual test program; virtual testing; Circuit testing; Electric variables measurement; Electronic circuits; Electronic equipment testing; Integrated circuit measurements; Integrated circuit technology; Laboratories; Product development; Pulp manufacturing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.

Conference_Location

Anaheim, CA

Print_ISBN

0-7803-1910-9

Type

conf

DOI

10.1109/AUTEST.1994.381578

Filename

381578