DocumentCode :
2515113
Title :
Improving military readiness and U.S. competitiveness through dual use design and test technology
Author :
Dearborn, William R. ; Anderson, Diana ; Barkley, Jeffrey
Author_Institution :
Loral Federal Systs., Owego, NY, USA
fYear :
1994
fDate :
20-22 Sep 1994
Firstpage :
495
Lastpage :
501
Abstract :
This paper describes the methodology and tools being developed under the Virtual Test (VTest) Program sponsored by Wright Laboratory´s, Manufacturing Technology Directorate. The VTest system will be a commercially available, test system independent, Integrated Process/Product Development (IP/PD) solution for the design and virtual testing of electronic circuits. The methodology and tools developed under the VTest program will provide measurable benefits to enterprises who have spread the printed circuit assembly (PCA) and line replaceable module (LRM) life-cycle across more than one location or test system, electrical design and manufacturing companies and electrical service depots
Keywords :
CAD; automatic test equipment; electronic equipment testing; military equipment; product development; virtual machines; Air Force; US competitiveness; VTest system; Wright Laboratory; design for test; dual use design; electrical design; electrical service depots; integrated process/product development; life-cycle; line replaceable module; military readiness; printed circuit assembly; virtual test program; virtual testing; Circuit testing; Electric variables measurement; Electronic circuits; Electronic equipment testing; Integrated circuit measurements; Integrated circuit technology; Laboratories; Product development; Pulp manufacturing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
Type :
conf
DOI :
10.1109/AUTEST.1994.381578
Filename :
381578
Link To Document :
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