• DocumentCode
    2515144
  • Title

    Tri-service automatic test system R&D program

  • Author

    Simpson, William R. ; Rolfe, Robert M.

  • Author_Institution
    Inst. for Defense Anal., Alexandria, VA, USA
  • fYear
    1994
  • fDate
    20-22 Sep 1994
  • Firstpage
    485
  • Lastpage
    489
  • Abstract
    Recent changes in the state-of-the-art in software development and test instrumentation has provided the Department of Defense with opportunities to reduce the cost of its automatic test systems (automatic test equipment and the software and information required to drive that equipment). In order to guide and enhance this evolution, the three Services (USN, USAF, USA) have developed an automatic test system research and development program consisting of three broad areas; automatic test system functional interface convergence, next generation test environment, and automatic test system modernization methods. This program, when funded, will provide the technology necessary to transition to the open architecture test systems of the future. The balance of this paper covers the eleven identified tasks under these broad areas, and how they form a coordinated, integrated basis for an improved acquisition strategy
  • Keywords
    automatic test equipment; computer architecture; military systems; open systems; research and development management; ATE; Department of Defense; R&D program; USA; USAF; USN; acquisition strategy; cost; functional interface convergence; modernization; next generation test environment; open architecture test systems; research and development program; software; triservice automatic test system; Application software; Automatic testing; Computer architecture; Costs; Electronic mail; Life testing; Production facilities; Research and development; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1910-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1994.381580
  • Filename
    381580