• DocumentCode
    2515248
  • Title

    The “hallucination” bound for the BSC

  • Author

    Sahai, Anant ; Draper, Stark C.

  • Author_Institution
    Dept. of EECS, Univ. of California at Berkeley, Berkeley, CA
  • fYear
    2008
  • fDate
    6-11 July 2008
  • Firstpage
    717
  • Lastpage
    721
  • Abstract
    Though the schemes are different, both Horstein\´s and Kudryashov\´s non-block strategies for communication with feedback over the binary-symmetric channel asymptotically achieve the identical reliability function (error exponent); a function that displays some curious features. For positive rates it is strictly larger than Burnashev\´s reliability function and transitions discontinuously at the channel capacity from a strictly positive value to zero. The purpose of this paper is to connect this reliability function to familiar coding contexts and to demonstrate that it provides an upper bound on the error exponents achievable in these contexts. We first show that this function gives a lower bound on the minimum probability of decoding error across codewords in a block-coding context with (or without) feedback. We then show that the same reliability function also gives an upper bound on the maximum probability of bit error in a non-block "streaming" context where noiseless feedback is available and the destination is (occasionally) allowed to declare erasures (per Forney). The basic insight underlying the bound leads to the moniker the "hallucination" bound.
  • Keywords
    binary codes; block codes; error statistics; probability; reliability; BSC; Burnashev reliability function; binary-symmetric channel; bit error; block-coding context; coding contexts; decoding error; feedback communication; hallucination bound; probability; upper bound; Block codes; Channel capacity; Computer displays; Computer errors; Decoding; Delay; Feedback; Protocols; Testing; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2008. ISIT 2008. IEEE International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-2256-2
  • Electronic_ISBN
    978-1-4244-2257-9
  • Type

    conf

  • DOI
    10.1109/ISIT.2008.4595080
  • Filename
    4595080