• DocumentCode
    2515280
  • Title

    Advanced software coldtest of electron devices with uSOS (TWTs)

  • Author

    Stockwell, B. ; Doniger, K. ; Friedlander, F.

  • Author_Institution
    Varian Associates, Palo Alto, CA, USA
  • fYear
    1989
  • fDate
    3-6 Dec. 1989
  • Firstpage
    207
  • Lastpage
    210
  • Abstract
    Advances in the design of vacuum electronics devices through the use of a code with software cold-test capability-the 3-D electromagnetic code uSOS-are shown. Descriptions are then given of three circuit geometries that have undergone software cold-test using the uSOS frequency-domain solver. The first structure is a racetrack-shaped cavity commonly used in klystron. The second example is the output cavity of an extended interaction klystron. The third geometry is a typical millitron coupled cavity TWT (traveling-wave tube) circuit. Comparisons of information obtained via software cold-test to that obtained conventionally are shown. Software cold-test is seen to be effective and economical.<>
  • Keywords
    electronic engineering computing; frequency-domain analysis; klystrons; travelling-wave-tubes; 3-D electromagnetic code uSOS; TWT circuits; extended interaction klystron; millitron coupled cavity TWT; output cavity; racetrack-shaped cavity; software cold-test capability; uSOS frequency-domain solver; vacuum electronics devices; Circuit testing; Coupling circuits; Electron devices; Frequency domain analysis; Geometry; Hardware; Klystrons; Microwave circuits; Resonance; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1989.74262
  • Filename
    74262