Title :
Behavioral stimulus generation for digital test programs
Author :
Puzio, Gregory ; Meunier, Frank
Author_Institution :
Integrated Test Solutions Inc., Concord, MA, USA
Abstract :
This paper describes a process, developed by Integrated Test Solutions, Inc. (ITS), that provides the test programmer with a new type of environment for developing true functional tests using ATPG. This process is called BEhavioral STimulus for TEST Development, or BestTest. BestTest allows for the development of true functional tests using much smaller test patterns than with conventional ATPG alone. Test vectors produced using the BestTest approach result in higher levels of fault detection at significantly lower cost. The heart of the BestTest approach is to provide the test programmer with a behavioral stimulus generation capability that provides for: the ability to generate conditional stimulus; the ability to create complex functions; and the ability to sense the state of the simulation at run time
Keywords :
automatic test software; digital instrumentation; economics; programming environments; software development management; ATPG; BestTest; Integrated Test Solutions; behavioral stimulus generation; digital test programs; fault detection; simulation; test patterns; test programmer; test vectors; true functional tests; Analytical models; Assembly; Automatic test pattern generation; Automatic testing; Circuit testing; Computational modeling; Connectors; Costs; Design engineering; Programming profession;
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
DOI :
10.1109/AUTEST.1994.381589