Title :
Diagnostician-on-a-chip (DOC)
Author :
Nolan, Mary ; Granieri, Michael N.
Author_Institution :
Giordano Autom. Corp., Sparta, NJ, USA
Abstract :
This paper describes the principal concepts and initial implementation of an innovative approach for embedding a diagnostic reasoning capability onto microcontroller. The approach is predicated upon the use of an automated concurrent engineering tool set that is utilized to develop a diagnostic knowledge base which is subsequently incorporated into microcontroller´s diagnostic run-time system. Examples of centralized and distributed architectures utilizing the subject approach are described
Keywords :
automatic test equipment; computer testing; diagnostic reasoning; distributed processing; fault diagnosis; integrated circuit testing; knowledge based systems; microcontrollers; parallel architectures; real-time systems; Diagnostician-on-a-chip; automated concurrent engineering tool set; built-in diagnostics; centralized architectures; diagnostic knowledge base; diagnostic reasoning capability; diagnostic run-time system; distributed architectures; embedding; microcontroller; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Control systems; Design for testability; Logic testing; Real time systems; Runtime environment; System testing;
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
DOI :
10.1109/AUTEST.1994.381591
