Title :
Analysis and Simulation of temperature-current rise in modern PCB traces
Author :
Petrosyants, Konstantin ; Kortunov, Artur ; Kharitonov, Igor ; Popov, Anton ; Gomanilova, Natalya ; Rjabov, Nikita
Author_Institution :
Higher Sch. of Econ., Moscow Inst. of Electron. & Math. of Nat. Res. Univ., Moscow, Russia
Abstract :
The temperature-current rise in modern (up to 100-150 microns wide) PCB traces is simulated using three software tools ANSYS, HyperLynxThermal and ELCUT. The results are compared with the IR measurements in PCB copper traces with different sizes and substrate materials. It is shown that ANSYS correctly describes the thermal behavior for all tests, other tools have some limitations for small size traces.
Keywords :
printed circuit design; printed circuit testing; printed circuits; ANSYS; ELCUT; HyperLynxThermal; modern PCB traces; temperature-current rise; thermal behavior; Analytical models; Copper; Current measurement; Finite element analysis; Simulation; Substrates; Temperature measurement;
Conference_Titel :
Design & Test Symposium (EWDTS), 2014 East-West
Conference_Location :
Kiev
DOI :
10.1109/EWDTS.2014.7027054
