• DocumentCode
    2515389
  • Title

    Transient analysis of transmission lines loaded by active devices illuminated by an electromagnetic pulse in the indoor environment

  • Author

    Wang, Jian ; Fang, Jin-Peng ; Yin, Wen-Yan

  • Author_Institution
    Center for Microwave & RF Technol. (CMRFT), Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    142
  • Lastpage
    145
  • Abstract
    A hybrid method, based on new FDTD (2, 4)-compatible conformal technique, telegraph equations and modified nodal analysis (MNA) method, is presented for transient analysis of a multi-conductor transmission line (MTL) network loaded with some active devices. The MTL network is located in a room with curved wall and is illuminated by an electromagnetic pulse (EMP). The accuracy of our developed algorithm is verified with good agreement achieved by comparing some results with those obtained by the CST MWS studio. However, it should be emphasized that our proposed hybrid method has stronger capability in handling MTLs loaded with arbitrary active devices than that of commercial software. The transient analysis of an external field coupled into a cabin is performed, with some inner EMI effects characterized accurately.
  • Keywords
    electromagnetic interference; electromagnetic pulse; finite difference time-domain analysis; telecommunication transmission lines; transient analysis; EMI effects; FDTD; compatible conformal technique; electromagnetic pulse; finite difference time-domain analysis; modified nodal analysis; multiconductor transmission lines; telegraph equations; transient analysis; EMP radiation effects; Electromagnetic interference; Equations; Finite difference methods; Indoor environments; Multiconductor transmission lines; Telegraphy; Time domain analysis; Transient analysis; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475763
  • Filename
    5475763