Title :
Partially programmable circuit design
Author :
Matrosova, A. ; Ostanin, S. ; Kirienko, I. ; Singh, V.
Author_Institution :
Tomsk State Univ., Tomsk, Russia
Abstract :
The new approach to partially programmable circuit design that allows masking arbitrary gate faults of a logical circuit is considered. It is supposed that only one gate may be fault. There are reserved blocks CLBs (configurable logic block) based on LUTs (Look up table) that may mask the gate fault. The suggested approach in comparison with the currently in use ones allows masking any gate fault but not the certain stuck-at faults at the gate poles.
Keywords :
fault diagnosis; logic design; logic gates; logic testing; table lookup; LUTs; arbitrary gate faults; configurable logic block; gate fault masking; gate poles; logical circuit; look up table; partially programmable circuit design; reserved blocks CLB; stuck-at faults; Boolean functions; Circuit faults; Combinational circuits; Data structures; Logic gates; Multiplexing; Vectors;
Conference_Titel :
Design & Test Symposium (EWDTS), 2014 East-West
Conference_Location :
Kiev
DOI :
10.1109/EWDTS.2014.7027067