Title :
Analysis of mutual inductance effect between decoupling capacitors on planar power bus
Author :
Kim, Jingook ; Archambeault, Bruce ; Knighten, James L. ; Fan, Jun
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
The physics associated with mutual inductance between vias has been analyzed, and a method has been proposed to calculate the total equivalent inductance including the effect of mutual inductance. The method has been further simplified to an expression in a closed-form. The equations have also been verified and shown to be accurate by measurements.
Keywords :
capacitors; inductance; decoupling capacitors; equivalent inductance; mutual inductance effect; planar power bus; Cavity resonators; Electromagnetic analysis; Electromagnetic compatibility; Equations; Impedance; Inductance measurement; Physics; Power capacitors; Resonant frequency; Voltage;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475781
