• DocumentCode
    2515714
  • Title

    Reducing capacity and conflict misses using Set Saturation Levels

  • Author

    Rolán, Dyer ; Fraguela, Basilio B. ; Doallo, Ramón

  • Author_Institution
    Dept. de Electron. e Sist., Univ. da Coruna, A Coruña, Spain
  • fYear
    2010
  • fDate
    19-22 Dec. 2010
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    The well-known memory wall problem has motivated wide research in the design of caches. Last-level caches, whose misses can stall the processors for hundreds of cycles, have received particular attention. Strategies to modify adaptably the cache insertion, promotion, eviction and even placement policies have been proposed, some techniques being better at reducing different kinds of misses. For example changes in the placement policy of a cache, which are a natural option to reduce conflict misses, can do little to fight capacity misses, which depend on the relation between the working set of the application and the cache size. Nevertheless, other techniques such as the recently proposed dynamic insertion policy (DIP), whose aim is to retain a fraction of the working set in the cache when it is larger than the cache size, attack primarily capacity misses. In this paper we present a coordinated strategy to reduce both capacity and conflict misses by changing the placement and insertion policies of the cache. Our strategy takes its decisions based on the concept of the Set Saturation Level (SSL), which tries to measure to which degree a set can hold its working set. Despite requiring only less than 1% storage overhead, our proposal, called Bimodal Set Balancing Cache, reduced the average miss rate of a baseline 2MB 8-way second level cache by 16%, which translated into an average IPC improvement of 4.8% in our experiments.
  • Keywords
    cache storage; memory architecture; DIP; SSL; bimodal set balancing cache; cache design; capacity miss reduction; conflict miss reduction; dynamic insertion policy; last-level cache; memory wall problem; set saturation level; Benchmark testing; Electronics packaging; Hardware; Measurement; Program processors; Proposals; Radiation detectors; Cache; adaptivity; balancing; insertion; performance; replacement; set saturation level; thrashing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Computing (HiPC), 2010 International Conference on
  • Conference_Location
    Dona Paula
  • Print_ISBN
    978-1-4244-8518-5
  • Electronic_ISBN
    978-1-4244-8519-2
  • Type

    conf

  • DOI
    10.1109/HIPC.2010.5713184
  • Filename
    5713184