DocumentCode
2515798
Title
Elemental Design Patterns Recognition In Java
Author
Arcelli, Francesca ; Masiero, Stefano ; Raibulet, Claudia
Author_Institution
Dipt. di Informatica Sistemistica e Comunicazione, Universita degli Studi di Milano-Bicocca, Milan
fYear
0
fDate
0-0 0
Firstpage
196
Lastpage
205
Abstract
The decomposition of design patterns into simpler elements may reduce significantly the creation of variants in forward engineering, while it increases the possibility of identifying applied patterns in reverse engineering. Nevertheless, there are few reverse engineering tools that exploit the decomposition of patterns (i.e., FUJABA, SPQR). The SPQR approach introduces a catalog of elemental design patterns (EDP) and a rule set based on sigma-calculus through which EDPs are defined and composed into design patterns. Considering the SPQR approach particularly interesting, we propose a novel solution for defining and detecting EDPs and, further, design patterns. Our approach defines EDPs as logical functions of eight symbolic variables, each variable representing a method call (e.g., method name, method signature, method declaration, this reference, super reference) or a class property (superclass, same family, same object). An EDP detector has been developed based on this approach, representing a starting point for future developments towards design pattern recognition in the reverse engineering context
Keywords
Java; object-oriented programming; process algebra; reverse engineering; Java; design pattern decomposition; elemental design pattern recognition; forward engineering; logical functions; method call; method declaration; method name; method signature; pattern identification; reverse engineering; sigma calculus; symbolic variables; Algorithm design and analysis; Calculus; Data mining; Design engineering; Detection algorithms; Detectors; Java; Pattern recognition; Reverse engineering; Unified modeling language;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Technology and Engineering Practice, 2005. 13th IEEE International Workshop on
Conference_Location
Budapest
Print_ISBN
0-7695-2639-X
Type
conf
DOI
10.1109/STEP.2005.12
Filename
1691648
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