A novel millimeter wave band-pass frequency selective surface transparent to infrared wave

Author

Zong, Zhiyuan ; Wu, Wen ; Shi, Lingfei ; Fang, Dagang

Author_Institution

Ministerial Key Lab. of JGMT, Nanjing Univ. of Sci. & Technol., Nanjing, China

fYear

2010

fDate

12-16 April 2010

Firstpage

162

Lastpage

165

Abstract

A novel millimeter wave (MMW) frequency selective surface (FSS) is proposed. The periodic elements of FSS are etched on a layer of semiconductor film. The film is transparent at infrared (IR) wavelength and periodic elements are designed to decrease the transmission loss due to the finite conductivity of the film at millimeter wavelength. An FSS with the resonant frequency at 35 GHz is designed. Simulated results show that the transmission properties of the FSS for MMW illuminated by both TE and TM incidences are satisfactory. In the meantime, the area of the elements is no more than 18% of the total FSS area that ensure the good transparency of the IR wave.

Keywords

band-pass filters; band-stop filters; frequency selective surfaces; high-pass filters; low-pass filters; millimetre wave filters; optical sensors; semiconductor thin films; spatial filters; IR wave; MMW-IR sensor; TE incidence; TM incidence; band-pass filter; band-stop filter; frequency 35 GHz; high-pass filter; infrared wavelength; low-pass filter; millimeter wave band-pass frequency selective surface; resonant frequency; semiconductor film; spatial filter; transmission loss; Electromagnetic interference; Etching; Frequency selective surfaces; Infrared sensors; Millimeter wave radar; Millimeter wave technology; Optical films; Resonant frequency; Semiconductor films; Tellurium; FFS; MMW; loss; semiconductor film;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on

Conference_Location

Beijing

Print_ISBN

978-1-4244-5621-5

Type

conf

DOI

10.1109/APEMC.2010.5475795

Filename

5475795