• DocumentCode
    2516053
  • Title

    High Throughput Short Read Alignment via Bi-directional BWT

  • Author

    Lam, T.W. ; Li, Ruiqiang ; Tam, Alan ; Wong, Simon ; Wu, Edward ; Yiu, S.M.

  • Author_Institution
    Dept of Comput. Sci., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2009
  • fDate
    1-4 Nov. 2009
  • Firstpage
    31
  • Lastpage
    36
  • Abstract
    The advancement of sequencing technologies has made it feasible for researchers to consider many high-throughput biological applications. A core step of these applications is to align an enormous amount of short reads to a reference genome. For example, to resequence a human genome, billions of reads of 35 bp are produced in 1-2 weeks, putting a lot of pressure of faster software for alignment. Based on existing indexing and pattern matching technologies, several short read alignment software have been developed recently. Yet this is still strong need to further improve the speed. In this paper, we show a new indexing data structure called bi-directional BWT, which allows us to build the fastest software for aligning short reads. When compared with existing software (Bowtie is the best), our software is at least 3 times faster for finding unique best alignments, and 25 times faster for finding all possible alignments. We believe that bi-directional BWT is an interesting data structure on its own and could be applied to other pattern matching problems.
  • Keywords
    bioinformatics; data structures; genomics; pattern matching; Burrows-Wheeler transform; bidirectional BWT; data structure; genome; high throughput short read alignment; pattern matching; sequencing technologies; Application software; Bidirectional control; Bioinformatics; Data structures; Genomics; Humans; Indexing; Pattern matching; Sequences; Throughput; BWT; indexing data structure; short read alignment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedicine, 2009. BIBM '09. IEEE International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-0-7695-3885-3
  • Type

    conf

  • DOI
    10.1109/BIBM.2009.42
  • Filename
    5341875