Title :
A novel electromagnetic radiated emission source identification methodology
Author :
Zhenfei, Song ; Donglin, Su ; Fei, Dai ; Duval, Fabrice ; Louis, Anne
Author_Institution :
EMC Lab., Beihang Univ., Beijing, China
Abstract :
The proposed novel electromagnetic radiated emission source identification method is based on Independent Component Analysis (ICA). The identification is conducted by processing a suitable number of radiated spectrum data which is obtained by measurements at different points around equipment under test (EUT). Using specific kurtosis-based ICA algorithm, we can not only distinguish EUT´s radiated emission from ambient electromagnetic noise, but also can extract emission feature of different radiation sources. Using correlated coefficient of extracted signal and original signal to investigate the accuracy of proposed method, the value can at least reach 0.98 and 0.72 for simulation and measurement data analysis respectively; feasibility and effectiveness of proposed method were verified by such good results.
Keywords :
electromagnetic compatibility; electronic equipment testing; independent component analysis; EUT; ambient electromagnetic noise; correlated coefficient; electromagnetic radiated emission source identification methodology; equipment under test; independent component analysis; kurtosis-based ICA algorithm; measurement data analysis; radiated spectrum data; Analytical models; Data mining; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Electromagnetic measurements; Electromagnetic radiation; Feature extraction; Independent component analysis; Signal processing;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475803