DocumentCode :
2516210
Title :
Defect list compression
Author :
Motta, Giovanni ; Ordentlich, Erik ; Weinberger, Marcelo J.
Author_Institution :
Qualcomm, Inc., San Diego, CA
fYear :
2008
fDate :
6-11 July 2008
Firstpage :
1000
Lastpage :
1004
Abstract :
We consider a setting relevant to the design of storage systems in which a list of defective storage blocks, as determined at manufacture time, is stored in a high-speed system controller memory to enable the efficient bypassing of defective blocks in a transparent manner, external to the system. Conventionally, such lists have been compressed losslessly to save on the cost of the controller memory. Under the assumption of a total system cost that is a linear combination of the number of storage blocks and the controller memory size, we study the potential benefits of compressing the defect list using lossy algorithms, with the restriction that the reconstructed defect list not label any defective storage blocks as being non-defective.
Keywords :
data analysis; data compression; storage management; controller memory size; defect list compression; high-speed system controller memory; lossy algorithms; storage systems; Control systems; Cost function; Data storage systems; Distortion measurement; Error correction codes; Laboratories; Manufacturing; Process control; Random access memory; Size control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-2256-2
Electronic_ISBN :
978-1-4244-2257-9
Type :
conf
DOI :
10.1109/ISIT.2008.4595137
Filename :
4595137
Link To Document :
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