• DocumentCode
    2516210
  • Title

    Defect list compression

  • Author

    Motta, Giovanni ; Ordentlich, Erik ; Weinberger, Marcelo J.

  • Author_Institution
    Qualcomm, Inc., San Diego, CA
  • fYear
    2008
  • fDate
    6-11 July 2008
  • Firstpage
    1000
  • Lastpage
    1004
  • Abstract
    We consider a setting relevant to the design of storage systems in which a list of defective storage blocks, as determined at manufacture time, is stored in a high-speed system controller memory to enable the efficient bypassing of defective blocks in a transparent manner, external to the system. Conventionally, such lists have been compressed losslessly to save on the cost of the controller memory. Under the assumption of a total system cost that is a linear combination of the number of storage blocks and the controller memory size, we study the potential benefits of compressing the defect list using lossy algorithms, with the restriction that the reconstructed defect list not label any defective storage blocks as being non-defective.
  • Keywords
    data analysis; data compression; storage management; controller memory size; defect list compression; high-speed system controller memory; lossy algorithms; storage systems; Control systems; Cost function; Data storage systems; Distortion measurement; Error correction codes; Laboratories; Manufacturing; Process control; Random access memory; Size control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2008. ISIT 2008. IEEE International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-2256-2
  • Electronic_ISBN
    978-1-4244-2257-9
  • Type

    conf

  • DOI
    10.1109/ISIT.2008.4595137
  • Filename
    4595137