DocumentCode
2516210
Title
Defect list compression
Author
Motta, Giovanni ; Ordentlich, Erik ; Weinberger, Marcelo J.
Author_Institution
Qualcomm, Inc., San Diego, CA
fYear
2008
fDate
6-11 July 2008
Firstpage
1000
Lastpage
1004
Abstract
We consider a setting relevant to the design of storage systems in which a list of defective storage blocks, as determined at manufacture time, is stored in a high-speed system controller memory to enable the efficient bypassing of defective blocks in a transparent manner, external to the system. Conventionally, such lists have been compressed losslessly to save on the cost of the controller memory. Under the assumption of a total system cost that is a linear combination of the number of storage blocks and the controller memory size, we study the potential benefits of compressing the defect list using lossy algorithms, with the restriction that the reconstructed defect list not label any defective storage blocks as being non-defective.
Keywords
data analysis; data compression; storage management; controller memory size; defect list compression; high-speed system controller memory; lossy algorithms; storage systems; Control systems; Cost function; Data storage systems; Distortion measurement; Error correction codes; Laboratories; Manufacturing; Process control; Random access memory; Size control;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Conference_Location
Toronto, ON
Print_ISBN
978-1-4244-2256-2
Electronic_ISBN
978-1-4244-2257-9
Type
conf
DOI
10.1109/ISIT.2008.4595137
Filename
4595137
Link To Document