Title :
Multi-aging test technology for estimating long time performance of polymer insulators
Author :
Cho, Han-Goo ; Han, Se-Won ; Lee, Un-Yong ; Kim, Suk-Su ; Lim, Kee-Joe
Author_Institution :
Korea Electrotechnology Res. Inst., Korea Electrotechnol. Res. Inst., Changwon, South Korea
Abstract :
This paper presents multi-stress chamber experiments and tracking wheel tests to examine the tracking and erosion performance of polymer insulators for transmission. Multi-stress testing is able to demonstrate deficiencies of polymer insulator materials and designs, including the nature of interfaces in insulation design. We have investigated IEC 61109 Annex C (5000 h aging test) and CEA tracking wheel test as test methods of artificial accelerated aging. The aging degree of the polymer insulator is estimated by leakage current, measurement of hydrophobicity degree, damage conditions of the insulator surface, and withstand voltage tests
Keywords :
ageing; environmental stress screening; insulator testing; leakage currents; life testing; polymer insulators; wear resistance; CEA tracking wheel test; IEC 61109 Annex C; artificial accelerated aging; erosion performance; hydrophobicity degree; insulation design; insulator surface damage conditions; interfaces; leakage current; long time performance; multi-aging test technology; multi-stress chamber experiments; polymer insulators; tracking performance; tracking wheel tests; withstand voltage tests; Accelerated aging; IEC standards; Insulation life; Insulation testing; Insulator testing; Leakage current; Materials testing; Plastic insulation; Polymers; Wheels;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
0-7803-5459-1
DOI :
10.1109/ICPADM.2000.875708
