• DocumentCode
    2516425
  • Title

    Protection design against system-level ESD transient disturbance on display panels

  • Author

    Ker, Ming-Dou ; Lin, Wan-Yen ; Yen, Cheng-Cheng ; Yang, Che-Ming ; Chen, Tung-Yang ; Chen, Shih-Fan

  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    438
  • Lastpage
    441
  • Abstract
    A hardware/firmware system co-design has been proposed in this work to protect display electronic products against system-level electrostatic discharge (ESD) transient disturbance. By including transient detection circuit, the firmware can execute system recovery procedure to recover all electrical functions under system-level ESD tests. The transient detection circuit is designed to detect different positive and negative fast electrical transients and verified in a 0.13-μm CMOS process. The experimental results have confirmed that the proposed hardware/firmware design can successfully improve the susceptibility of display products against system-level ESD zapping.
  • Keywords
    CMOS integrated circuits; computer displays; electronic products; electrostatic discharge; firmware; flat panel displays; hardware-software codesign; system recovery; transients; CMOS process; display panels; hardware-firmware system co-design; negative fast electrical transients; positive fast electrical transients; size 0.13 mum; system recovery procedure; system-level ESD transient disturbance; system-level ESD zapping; system-level electrostatic discharge transient disturbance; transient detection circuit; Circuit testing; Electrostatic discharge; IEC standards; Liquid crystal displays; Microelectronics; Microprogramming; Power system transients; Protection; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475821
  • Filename
    5475821