• DocumentCode
    2516459
  • Title

    Boron Oxide Encapsulated Vertical Bridgman: a Method for Preventing Crystal-Crucible Contact in the CdZnTe Growth

  • Author

    Zappettini, Andrea ; Zha, Mingzheng ; Pavesi, Maura ; Bissoli, Francesco ; Zanotti, Lucio

  • Author_Institution
    IMEM-CNR, Parma
  • Volume
    6
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    3739
  • Lastpage
    3741
  • Abstract
    One of the reasons for the formation of twins and grain boundaries during the CdZnTe crystal growth is the crystal-crucible interaction, typical of the vertical Bridgman technique. Particularly detrimental seems to be the use of quartz crucibles that ease the sticking of the crystal to the crucible walls. Due to this reason, many authors suggest the use of graphite crucibles or of carbon coated quartz crucibles. In order to avoid the contact between the growing crystal and the crucible, it was proposed to opportunely control the wetting angle. However, it was shown that this is possible only under microgravity conditions or by imposing a pressure difference between the melt and the solidifying crystal. In this work, we show that it is possible to avoid the contact between the crystal and the crucible by interposing a thin liquid boron oxide layer. This condition can be obtained in a vertical Bridgman furnace by covering the polycrystalline charge with a boron oxide pellet. In this way, crystals with large single grains were obtained also in quartz crucibles. Moreover, the crystals show low dislocation density, as expected in the case of crystals grown without contact with the crucible.
  • Keywords
    II-VI semiconductors; boron compounds; cadmium compounds; crystal growth from melt; grain boundaries; semiconductor counters; CdZnTe; CdZnTe crystal growth; boron oxide; carbon coated quartz crucible; crystal-crucible interaction; dislocation density; grain boundaries; graphite crucibles; microgravity; polycrystalline charge; twin boundary; vertical Bridgman method; wetting angle; Boron; Contamination; Counting circuits; Crystals; Detectors; Furnaces; Grain boundaries; Nuclear and plasma sciences; Soldering; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.353807
  • Filename
    4179849