DocumentCode
2516659
Title
Nucam: a 128 Channel Integrated Circuit with Pulse-Height and Rise-Time Measurement on Each Channel Including on-Chip 12bit ADC for High-Z X-Ray Detectors
Author
Seller, P. ; Hardie, A.L. ; Jones, L.L. ; Boston, A.J. ; Rigby, S.V.
Author_Institution
CCLRC, Rutherford Appleton Lab., Didcot
Volume
6
fYear
2006
fDate
Oct. 29 2006-Nov. 1 2006
Firstpage
3786
Lastpage
3789
Abstract
The Nucam chip is a 128 channel low-noise application specific integrated circuit primarily intended for readout of CZT and CdTe detectors. The data driven ASIC channels recognise signals above threshold and store the analogue levels in peak-hold circuits. Signals from all peak-holds are routed to a single 1 MHz through-put 12-bit ADC. The digital result of this is output together with the channel number and a 6-bit collection-time estimate for the signal. The collection-time is estimated by differentiating the signal and clocking a counter during the time over zero. This collection-time gives an estimate of the hole contribution to the predominantly electron signal in thick semiconductor detectors. This can then be used in an off-line correction for charge carrier trapping and ballistic deficit. We explain the architecture and specification of the ASIC and measurements carried out to assess the operation and performance of the circuits. We show initial results with a CZT detector and the modifications that are being made to the ASIC to optimise it for future applications.
Keywords
X-ray detection; analogue-digital conversion; application specific integrated circuits; ballistic transport; cadmium compounds; electron traps; nuclear electronics; readout electronics; semiconductor counters; 128 channel integrated circuit; CZT detectors; CdTe detectors; Nucam chip; ballistic deficit; charge carrier trapping; collection time estimate; high-Z X-ray detectors; low-noise application specific integrated circuit; on-chip 12 bit ADC; pulse height measurement; readout electronics; rise time measurement; thick semiconductor detector; Application specific integrated circuits; Charge carrier processes; Charge carriers; Clocks; Counting circuits; Integrated circuit measurements; Pulse circuits; Pulse measurements; Semiconductor device measurement; X-ray detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location
San Diego, CA
ISSN
1095-7863
Print_ISBN
1-4244-0560-2
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2006.353817
Filename
4179859
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