• DocumentCode
    2516659
  • Title

    Nucam: a 128 Channel Integrated Circuit with Pulse-Height and Rise-Time Measurement on Each Channel Including on-Chip 12bit ADC for High-Z X-Ray Detectors

  • Author

    Seller, P. ; Hardie, A.L. ; Jones, L.L. ; Boston, A.J. ; Rigby, S.V.

  • Author_Institution
    CCLRC, Rutherford Appleton Lab., Didcot
  • Volume
    6
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    3786
  • Lastpage
    3789
  • Abstract
    The Nucam chip is a 128 channel low-noise application specific integrated circuit primarily intended for readout of CZT and CdTe detectors. The data driven ASIC channels recognise signals above threshold and store the analogue levels in peak-hold circuits. Signals from all peak-holds are routed to a single 1 MHz through-put 12-bit ADC. The digital result of this is output together with the channel number and a 6-bit collection-time estimate for the signal. The collection-time is estimated by differentiating the signal and clocking a counter during the time over zero. This collection-time gives an estimate of the hole contribution to the predominantly electron signal in thick semiconductor detectors. This can then be used in an off-line correction for charge carrier trapping and ballistic deficit. We explain the architecture and specification of the ASIC and measurements carried out to assess the operation and performance of the circuits. We show initial results with a CZT detector and the modifications that are being made to the ASIC to optimise it for future applications.
  • Keywords
    X-ray detection; analogue-digital conversion; application specific integrated circuits; ballistic transport; cadmium compounds; electron traps; nuclear electronics; readout electronics; semiconductor counters; 128 channel integrated circuit; CZT detectors; CdTe detectors; Nucam chip; ballistic deficit; charge carrier trapping; collection time estimate; high-Z X-ray detectors; low-noise application specific integrated circuit; on-chip 12 bit ADC; pulse height measurement; readout electronics; rise time measurement; thick semiconductor detector; Application specific integrated circuits; Charge carrier processes; Charge carriers; Clocks; Counting circuits; Integrated circuit measurements; Pulse circuits; Pulse measurements; Semiconductor device measurement; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.353817
  • Filename
    4179859