DocumentCode :
2516683
Title :
Cost reduction technology for high-efficiency photovoltaics: Research issues and progress
Author :
Benner, J.P.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
1991
fDate :
7-11 Oct 1991
Firstpage :
7
Abstract :
An overview is presented of the Department of Energy (DOE) photovoltaic program´s research on III-V solar cells directed toward establishing the base of technology necessary to design lower cost production processes and improve the reliability of manufacturing projections. It is shown that cost reduction in the high-efficiency technologies requires a three-pronged attack. First, increasing the efficiency is still the most direct path to lowering the cost of photovoltaic (PV) modules, provided that the additional device sophistication does not add cost. The second prong is to improve the technologies for crystal growth. Production cost factors related to large-area uniformity, yield, process safety, and source utilization efficiency are inseparable from the more esoteric scientific issues such as thermal geometry, reaction chemistry, crystallographic orientation effects, spinodal decomposition, and interdiffusion. Finally, an improved technology and new concepts are needed to eliminate the cost of consuming a crystalline substrate
Keywords :
III-V semiconductors; economics; solar cells; Department of Energy; III-V solar cells; PV modules; Research issues; cost reduction; crystal growth; crystalline substrate; crystallographic orientation effects; high-efficiency photovoltaics; interdiffusion; large-area uniformity; process safety; reaction chemistry; source utilization efficiency; spinodal decomposition; thermal geometry; yield; Chemical technology; Costs; III-V semiconductor materials; Manufacturing processes; Photovoltaic cells; Product safety; Production; Thermal decomposition; Thermal factors; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
Type :
conf
DOI :
10.1109/PVSC.1991.169170
Filename :
169170
Link To Document :
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