• DocumentCode
    2516708
  • Title

    Optimizing burst erasure correction of LDPC codes by interleaving

  • Author

    Sridharan, Gokul ; Kumarasubramanian, Abishek ; Thangaraj, Andrew ; Bhashyam, Srikrishna

  • Author_Institution
    Electr. Eng. Dept., Indian Inst. of Technol. Madras, Chennai
  • fYear
    2008
  • fDate
    6-11 July 2008
  • Firstpage
    1143
  • Lastpage
    1147
  • Abstract
    The performance of iterative decoding of low density parity check (LDPC) codes over binary erasure channels can be completely characterized by the study of stopping sets. Therefore, the burst erasure correction capability of a given LDPC code can be readily quantified by searching for stopping sets within consecutive bit nodes. In this work we study the optimal permutation of the bit nodes that will result in the maximum possible burst erasure correction capability for a given LDPC code. Noting that this is essentially a combinatorial optimization problem that is highly likely to be NP-hard, we adopt a simulated annealing based approach for finding the optimal permutation. We present bounds based on stopping sets that limit the burst erasure correction capability. As part of our results, we provide interleavers that greatly improve the burst erasure correction capability of protograph quasi-cyclic LDPC codes used in the WiMax standard.
  • Keywords
    WiMax; cyclic codes; error correction codes; iterative decoding; parity check codes; simulated annealing; LDPC codes; WiMax standard; burst erasure correction optimization; combinatorial optimization problem; iterative decoding; low density parity check codes; optimal permutation; quasi-cyclic codes; simulated annealing based approach; Code standards; Computational modeling; Error correction codes; Interference; Interleaved codes; Iterative algorithms; Iterative decoding; Parity check codes; Simulated annealing; WiMAX;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2008. ISIT 2008. IEEE International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-2256-2
  • Electronic_ISBN
    978-1-4244-2257-9
  • Type

    conf

  • DOI
    10.1109/ISIT.2008.4595166
  • Filename
    4595166