DocumentCode
2517012
Title
FPGA programmable PLL impact on EMC behavior
Author
Yuan, Shih-Yi ; Wu, Cheng-Hsieh ; Liao, Shry-Sann
Author_Institution
Dept. of Commun. Eng., Feng Chia Univ., Taichung, Taiwan
fYear
2010
fDate
12-16 April 2010
Firstpage
1072
Lastpage
1075
Abstract
This paper studies the impact of EMC on a programmable PLL feature of both FPGA-based IC and PIC series microcontroller (μC). We use ACTEL FPGA IC the target IC and design the testing board according to IEC standard. By using the TEM-CELL method to measure the electromagnetic radiation from the circuit board, different PLL EMC behaviors of the PIC μC with the FPGA-based design are compared. Generally, the EMC effect of FPGA is worse than that of the commercial PIC μC. Among all of the measurement results, it shows that the different PLL output frequency setups have different and crucial EMC impact.
Keywords
IEC standards; TEM cells; electromagnetic waves; field programmable gate arrays; integrated circuit design; integrated circuit testing; microcontrollers; phase locked loops; ACTEL FPGA IC; FPGA programmable PLL impact; IEC standard; PIC series microcontroller; PLL EMC behavior; TEM-CELL method; circuit board; electromagnetic radiation; testing board design; Circuit testing; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic radiation; Field programmable gate arrays; IEC standards; Integrated circuit testing; Microcontrollers; Phase locked loops; Printed circuits; EMC; EMI; IEC; PLL;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5621-5
Type
conf
DOI
10.1109/APEMC.2010.5475854
Filename
5475854
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