Title :
FPGA programmable PLL impact on EMC behavior
Author :
Yuan, Shih-Yi ; Wu, Cheng-Hsieh ; Liao, Shry-Sann
Author_Institution :
Dept. of Commun. Eng., Feng Chia Univ., Taichung, Taiwan
Abstract :
This paper studies the impact of EMC on a programmable PLL feature of both FPGA-based IC and PIC series microcontroller (μC). We use ACTEL FPGA IC the target IC and design the testing board according to IEC standard. By using the TEM-CELL method to measure the electromagnetic radiation from the circuit board, different PLL EMC behaviors of the PIC μC with the FPGA-based design are compared. Generally, the EMC effect of FPGA is worse than that of the commercial PIC μC. Among all of the measurement results, it shows that the different PLL output frequency setups have different and crucial EMC impact.
Keywords :
IEC standards; TEM cells; electromagnetic waves; field programmable gate arrays; integrated circuit design; integrated circuit testing; microcontrollers; phase locked loops; ACTEL FPGA IC; FPGA programmable PLL impact; IEC standard; PIC series microcontroller; PLL EMC behavior; TEM-CELL method; circuit board; electromagnetic radiation; testing board design; Circuit testing; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic radiation; Field programmable gate arrays; IEC standards; Integrated circuit testing; Microcontrollers; Phase locked loops; Printed circuits; EMC; EMI; IEC; PLL;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475854