Title : 
Diversity and degrees of freedom of cooperative wireless networks
         
        
            Author : 
Sreeram, K. ; Birenjith, S. ; Kumar, P. Vijay
         
        
            Author_Institution : 
Dept. of ECE, Indian Inst. of Sci., Bangalore
         
        
        
        
        
        
            Abstract : 
Two key parameters in the outage characterization of a wireless fading network are the diversity and the degrees of freedom (DOF). These two quantities represent the two end-points of the diversity multiplexing gain tradeoff. In this paper, we present max-flow min-cut type theorems for computing both the diversity and the DOF of arbitrary single-source single-sink networks with nodes possessing multiple antennas. We also show that an amplify-and-forward protocol is sufficient to achieve the same. The DOF characterization is obtained using a conversion to a deterministic wireless network for which the capacity was recently found. This conversion is operational in the sense that a capacity-achieving scheme for the deterministic network can be converted into a DOF-achieving scheme for the fading network. We also show that the diversity result easily extends to multi-source multi-sink networks whereas the DOF result extends to a single-source multi-cast network. Along the way, we prove that the zero error capacity of the deterministic network is the same as its isin-error capacity.
         
        
            Keywords : 
diversity reception; fading channels; multibeam antennas; multicast communication; protocols; amplify-and-forward protocol; cooperative wireless networks; degrees of freedom; deterministic wireless network; diversity multiplexing gain; multicast network; multiple antennas; outage characterization; wireless fading network; zero error capacity; Antenna theory; Computer networks; Fading; Galois fields; Interference; MIMO; Protocols; Rayleigh channels; Relays; Wireless networks;
         
        
        
        
            Conference_Titel : 
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
         
        
            Conference_Location : 
Toronto, ON
         
        
            Print_ISBN : 
978-1-4244-2256-2
         
        
            Electronic_ISBN : 
978-1-4244-2257-9
         
        
        
            DOI : 
10.1109/ISIT.2008.4595188