• DocumentCode
    2517219
  • Title

    Study on impedance extraction methods applied in conductive EMI source modeling

  • Author

    Zhao, Yang ; Lu, Xiaoquan ; Dong, Yinghua ; Luo, Yongchao ; Yan, Wei ; Rong, Rong

  • Author_Institution
    Sch. of Electr. & Autom. Eng., Nanjing Normal Univ., Nanjing, China
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    998
  • Lastpage
    1001
  • Abstract
    Two-current probes method and S-parameter method are studied comparatively for conductive EMI noise source modelling in this paper. Firstly, the basic theory of the two-current probes method and S-parameter method are introduced for noise source impedance extraction. Secondly, ZX and Zsetup are important intermediate results in the two methods, therefore their extractions are analyzed respectively. Moreover, the single probe method is proposed to obtain better accuracy, stability and low-cost. The experimental results show that due to the parasitic effect, the lengths of short wire in two-current probes method have negative effects on Zsetup extraction. And the direct measurement method in S-parameter method is superior in Zsetup extraction. The inaccuracies of the two-current probes method and S-parameter method for ZX amplitude extraction reach to 4% and 1.5%, and S-parameter method has a comparatively better performance on both ZX amplitude and phase extraction.
  • Keywords
    electric impedance; electromagnetic interference; impulse noise; S-parameter method; conductive EMI noise source modeling; current probe measurement; impedance extraction methods; two-current probes method; Circuit noise; Circuit testing; Current measurement; Electromagnetic interference; Equivalent circuits; Impedance measurement; Noise measurement; Probes; Scattering parameters; Signal generators; EMC; EMI noise modeling; S-parameter measurement; current probe measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475867
  • Filename
    5475867