DocumentCode :
2517219
Title :
Study on impedance extraction methods applied in conductive EMI source modeling
Author :
Zhao, Yang ; Lu, Xiaoquan ; Dong, Yinghua ; Luo, Yongchao ; Yan, Wei ; Rong, Rong
Author_Institution :
Sch. of Electr. & Autom. Eng., Nanjing Normal Univ., Nanjing, China
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
998
Lastpage :
1001
Abstract :
Two-current probes method and S-parameter method are studied comparatively for conductive EMI noise source modelling in this paper. Firstly, the basic theory of the two-current probes method and S-parameter method are introduced for noise source impedance extraction. Secondly, ZX and Zsetup are important intermediate results in the two methods, therefore their extractions are analyzed respectively. Moreover, the single probe method is proposed to obtain better accuracy, stability and low-cost. The experimental results show that due to the parasitic effect, the lengths of short wire in two-current probes method have negative effects on Zsetup extraction. And the direct measurement method in S-parameter method is superior in Zsetup extraction. The inaccuracies of the two-current probes method and S-parameter method for ZX amplitude extraction reach to 4% and 1.5%, and S-parameter method has a comparatively better performance on both ZX amplitude and phase extraction.
Keywords :
electric impedance; electromagnetic interference; impulse noise; S-parameter method; conductive EMI noise source modeling; current probe measurement; impedance extraction methods; two-current probes method; Circuit noise; Circuit testing; Current measurement; Electromagnetic interference; Equivalent circuits; Impedance measurement; Noise measurement; Probes; Scattering parameters; Signal generators; EMC; EMI noise modeling; S-parameter measurement; current probe measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475867
Filename :
5475867
Link To Document :
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