DocumentCode :
2517363
Title :
Statistical and Evolutionary Techniques for Efficient Electrical Design Space Exploration
Author :
Mutnury, Bhyrav ; Singh, Navraj ; Pham, Nam ; Cases, Moises
Author_Institution :
IBM Syst. & Technol. Group, Austin, TX, USA
fYear :
2008
fDate :
9-12 Dec. 2008
Firstpage :
58
Lastpage :
64
Abstract :
With the increasing complexity of today´s high speed electrical interfaces, electrical analysis of these interfaces is becoming exponentially complicated. Careful choice of channel design parameters for electrical modeling and analysis is becoming critical. Often, the electrical design space is too large for a full factorial analysis. Complex interfaces with large design spaces also make traditional techniques like Monte Carlo methods very time-consuming. Although faster statistical sampling methods such as Design of Experiments (DOE) can be very efficient, these methods are efficient only for linear or weakly non-linear design spaces. This paper compares DOE techniques with evolutionary algorithms for electrical design space exploration. Genetic Algorithms and Swarm Intelligence are discussed as evolutionary algorithms in this paper. The proposed approaches can be applied for high speed multi-drop interfaces like DDR2 and DDR3 and serial point-point interfaces like PCIe and Gigabit Ethernet. In this paper, serial and multi-drop test cases were analyzed to compare the performance of DOE and evolutionary techniques.
Keywords :
Monte Carlo methods; design of experiments; genetic algorithms; high-speed integrated circuits; integrated memory circuits; DDR2; DDR3; Gigabit ethernet; Monte Carlo methods; channel design parameters; complex interfaces; design of experiments; electrical analysis; electrical design space exploration; electrical modeling; genetic algorithms; high speed electrical interfaces; multidrop test; nonlinear design spaces; serial point-point interfaces; swarm intelligence; Algorithm design and analysis; Design methodology; Ethernet networks; Evolutionary computation; Genetic algorithms; Particle swarm optimization; Sampling methods; Space exploration; Testing; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2117-6
Electronic_ISBN :
978-1-4244-2118-3
Type :
conf
DOI :
10.1109/EPTC.2008.4763412
Filename :
4763412
Link To Document :
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