• DocumentCode
    2517363
  • Title

    Statistical and Evolutionary Techniques for Efficient Electrical Design Space Exploration

  • Author

    Mutnury, Bhyrav ; Singh, Navraj ; Pham, Nam ; Cases, Moises

  • Author_Institution
    IBM Syst. & Technol. Group, Austin, TX, USA
  • fYear
    2008
  • fDate
    9-12 Dec. 2008
  • Firstpage
    58
  • Lastpage
    64
  • Abstract
    With the increasing complexity of today´s high speed electrical interfaces, electrical analysis of these interfaces is becoming exponentially complicated. Careful choice of channel design parameters for electrical modeling and analysis is becoming critical. Often, the electrical design space is too large for a full factorial analysis. Complex interfaces with large design spaces also make traditional techniques like Monte Carlo methods very time-consuming. Although faster statistical sampling methods such as Design of Experiments (DOE) can be very efficient, these methods are efficient only for linear or weakly non-linear design spaces. This paper compares DOE techniques with evolutionary algorithms for electrical design space exploration. Genetic Algorithms and Swarm Intelligence are discussed as evolutionary algorithms in this paper. The proposed approaches can be applied for high speed multi-drop interfaces like DDR2 and DDR3 and serial point-point interfaces like PCIe and Gigabit Ethernet. In this paper, serial and multi-drop test cases were analyzed to compare the performance of DOE and evolutionary techniques.
  • Keywords
    Monte Carlo methods; design of experiments; genetic algorithms; high-speed integrated circuits; integrated memory circuits; DDR2; DDR3; Gigabit ethernet; Monte Carlo methods; channel design parameters; complex interfaces; design of experiments; electrical analysis; electrical design space exploration; electrical modeling; genetic algorithms; high speed electrical interfaces; multidrop test; nonlinear design spaces; serial point-point interfaces; swarm intelligence; Algorithm design and analysis; Design methodology; Ethernet networks; Evolutionary computation; Genetic algorithms; Particle swarm optimization; Sampling methods; Space exploration; Testing; US Department of Energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2117-6
  • Electronic_ISBN
    978-1-4244-2118-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2008.4763412
  • Filename
    4763412