• DocumentCode
    2517420
  • Title

    Single-electron tunneling through an asymmetrical tunnel barrier

  • Author

    Amakawa, S. ; Fujishima, M. ; Hoh, K.

  • Author_Institution
    Dept. of Inf. & Commun. Eng., Tokyo Univ., Japan
  • fYear
    1998
  • fDate
    19-21 Oct. 1998
  • Firstpage
    137
  • Lastpage
    140
  • Abstract
    Issues pertaining to single-electron tunneling through an asymmetrical tunnel barrier are discussed. A simple means of incorporating the change in the barrier shape accompanying a tunneling event into calculation of tunnel resistance is proposed. Simulation results show that directionality of tunneling through asymmetrical tunnel barriers is not as strong as reported previously, and that even an unphysical effect could arise if the barrier shape change is neglected.
  • Keywords
    resonant tunnelling; single electron transistors; asymmetrical tunnel barrier; barrier shape; single-electron tunneling; tunnel resistance; Capacitors; Circuit simulation; Electrodes; Electronic switching systems; Electrons; Shape; Surface resistance; Tunneling; US Department of Transportation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 1998. IWCE-6. Extended Abstracts of 1998 Sixth International Workshop on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    0-7803-4369-7
  • Type

    conf

  • DOI
    10.1109/IWCE.1998.742730
  • Filename
    742730