• DocumentCode
    2517459
  • Title

    Almost everywhere high nonuniform complexity

  • Author

    Lutz, Jack H.

  • Author_Institution
    Dept. of Comput. Sci., Iowa State Univ., Ames, IA, USA
  • fYear
    1989
  • fDate
    19-22 Jun 1989
  • Firstpage
    37
  • Lastpage
    53
  • Abstract
    Investigates the distribution of nonuniform complexities in uniform complexity classes. The author proves that almost every problem decidable in exponential space has essentially maximum circuit-size and program-size complexity almost everywhere. In exponential-time complexity classes, he proves that the strongest relativizable lower bounds hold almost everywhere for almost all problems. He shows that infinite pseudorandom sequences have high nonuniform complexity almost everywhere. The results are unified by a refined formulation of the underlying measure theory and by the introduction of a new nonuniform complexity measure, the selective program-size complexity
  • Keywords
    computational complexity; decidable; exponential space; exponential-time; nonuniform complexities; program-size complexity; pseudorandom sequences; uniform complexity classes; Binary sequences; Boolean functions; Circuits; Computer science; Lifting equipment; Polynomials; Size measurement; Time factors; Time measurement; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Structure in Complexity Theory Conference, 1989. Proceedings., Fourth Annual
  • Conference_Location
    Eugene, OR
  • Print_ISBN
    0-8186-1958-9
  • Type

    conf

  • DOI
    10.1109/SCT.1989.41813
  • Filename
    41813