DocumentCode
2517780
Title
Measurements of field distributions and scattering parameters in multiconductor structures using an electric field probe
Author
Yingjie Gao ; Wolff, I.
Author_Institution
Dept. of Electr. Eng., Gerhard Mercator Univ., Duisburg, Germany
Volume
3
fYear
1997
fDate
8-13 June 1997
Firstpage
1741
Abstract
A simple electric coaxial field probe for application in the 0.05-20 GHz band has been developed, which can measure not only the magnitude and the phase of the microwave field distribution inside multiconductor RF and microwave circuits, but also the scattering parameters at arbitrary reference planes inside the structures can be measured using this technique.
Keywords
S-parameters; UHF measurement; electric field measurement; magnetic field measurement; microwave measurement; probes; 0.05 to 20 GHz; RF circuits; arbitrary reference planes; coaxial field probe; electric field probe; field distribution measurement; microwave circuits; microwave field distribution; multiconductor structures; scattering parameter measurement; Coaxial components; Electric variables measurement; Magnetic field measurement; Microstrip; Microwave circuits; Microwave measurements; Microwave theory and techniques; Phase measurement; Probes; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location
Denver, CO, USA
ISSN
0149-645X
Print_ISBN
0-7803-3814-6
Type
conf
DOI
10.1109/MWSYM.1997.596855
Filename
596855
Link To Document