• DocumentCode
    2517866
  • Title

    Application of cumulant expansion to the modeling of non-local effects in semiconductor devices

  • Author

    Wang, E.X. ; Stettler, M. ; Yu, S. ; Maziar, C.

  • Author_Institution
    Intel Corp., Santa Clara, CA, USA
  • fYear
    1998
  • fDate
    19-21 Oct. 1998
  • Firstpage
    234
  • Lastpage
    237
  • Abstract
    The cumulant expansion method is proposed to solve the Boltzmann transport equation (BTE) in semiconductors. This method involves deriving a set of partial differential equations for the expansion coefficients from a Fourier transformation of the BTE. The collision terms for phonon emission and absorption scattering are obtained directly from quantum computed scattering transition rates, without invoking the relaxation time approximation. Unlike the moment expansion method used in hydrodynamic models, the cumulant expansion converges much faster when the distribution function is close to a drifted maxwellian because, for this case, only the first three cumulants are non-zero. This method also provides a way to construct an arbitrary distribution function from the computed cumulants, without being limited to a shifted maxwellian.
  • Keywords
    Boltzmann equation; Fourier transforms; electron-phonon interactions; higher order statistics; partial differential equations; semiconductor device models; Boltzmann transport equation; Fourier transformation; absorption scattering; collision terms; cumulant expansion; distribution function; drifted maxwellian; expansion coefficients; modelling; nonlocal effects; partial differential equations; phonon emission; quantum computed scattering transition rates; semiconductor devices; Absorption; Distribution functions; Educational institutions; Equations; Hydrodynamics; Particle scattering; Phonons; Quantum computing; Semiconductor devices; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 1998. IWCE-6. Extended Abstracts of 1998 Sixth International Workshop on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    0-7803-4369-7
  • Type

    conf

  • DOI
    10.1109/IWCE.1998.742754
  • Filename
    742754