• DocumentCode
    2517912
  • Title

    A stepwise evolutionary approach to machine learning

  • Author

    Hintz, Kenneth J.

  • Author_Institution
    ECE Dept., George Mason Univ., Fairfax, VA, USA
  • fYear
    1988
  • fDate
    24-26 Aug 1988
  • Firstpage
    559
  • Lastpage
    563
  • Abstract
    The biological concepts of stepwise evolution and cumulative selection are used to develop programs for a digital computer. The initial goal of these programs is to separate small, two-dimensional arrays of binary valued patterns into two classes. Learning is accomplished by the automatic evaluation of a criterion of separability of the two classes for each of the possible single-step mutations of the initial classification program. The mutant program which performs best is then selected automatically by the environment program and used as the new classification program. Only four operations are initially available, but as each classification program is mutated and cumulatively selected based on its performance, a new classification program is developed for implementing this particular classification. Each resulting program is then assigned a next sequential number, stored in mass storage, and made available for use as a single program step by subsequent programs. As the development program is run, it not only learns how to dichotomize more patterns but also has available to it the results of previous evolutionary learning experiences
  • Keywords
    automatic programming; biocybernetics; computerised pattern recognition; learning systems; binary valued pattern recognition; biological concepts; classification program; machine learning; separability; single-step mutations; stepwise evolutionary approach; Application software; Biological information theory; Biology computing; Data mining; Evolution (biology); Genetic mutations; Machine learning; Organisms; Polynomials; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control, 1988. Proceedings., IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    2158-9860
  • Print_ISBN
    0-8186-2012-9
  • Type

    conf

  • DOI
    10.1109/ISIC.1988.65491
  • Filename
    65491