• DocumentCode
    2518402
  • Title

    Calibration of Equivalent Finite Element Model for Packaged Printed Circuit Board by Experimental Modal Analysis

  • Author

    Lee, Ying-Chih ; Wang, Bor-Tsuen ; Lail, Yi-Shao ; Yeh, Chang-Lin ; Chen, Rong-Sheng

  • Author_Institution
    Dept. of Eng. Sci., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2008
  • fDate
    9-12 Dec. 2008
  • Firstpage
    424
  • Lastpage
    428
  • Abstract
    In this work, the experimental modal analysis (EMA) was performed to establish an equivalent finite element (FE) model for a standard JEDEC drop test printed circuit board (PCB) mounted with packages in a full array. Material properties of the equivalent FE model of the packaged PCB were calibrated through an optimization process with respect to natural frequencies based on EMA results obtained with a free boundary condition. The model was then applied to determine screwing tightness of the packaged PCB corresponding to a fixed boundary condition with the four corners of the PCB constrained, as defined by JEDEC for a board-level drop test.
  • Keywords
    calibration; finite element analysis; modal analysis; optimisation; printed circuit testing; printed circuits; JEDEC; board-level drop test; calibration; equivalent finite element was model; experimental modal analysis; free boundary condition; natural frequencies; optimization; packaged PCB; packaged printed circuit board; screwing tightness; Boundary conditions; Calibration; Circuit testing; Finite element methods; Frequency; Material properties; Modal analysis; Packaging; Performance evaluation; Printed circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2117-6
  • Electronic_ISBN
    978-1-4244-2118-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2008.4763471
  • Filename
    4763471