• DocumentCode
    2518486
  • Title

    A study on the influence of partial discharges on the performance of solid dielectrics

  • Author

    Nagamani, H.N. ; Moorching, S.N.

  • Author_Institution
    Central Power Res. Inst., Bangalore, India
  • fYear
    1998
  • fDate
    22-25 Jun 1998
  • Firstpage
    127
  • Lastpage
    130
  • Abstract
    The authors show that the Inverse Power Law model seems to fit the physical process of degradation of solid insulation under the influence of partial discharge activity. The present study also indicates that the presence of electrical trees in XLPE leads to partial discharges, the magnitude of which appears to depend on the tree length. Electrical treeing does not appear to contribute to tan δ and insulation resistance. The influence of PD activity on the life depends on the type of insulation in which partial discharges are taking place. For example, partial discharge magnitude of 200 pC results in a characteristic life of 2500 hours for MPPF capacitors, whereas a PD magnitude as high as 9000 pC results in a life of more than 5000 hours for machine insulation
  • Keywords
    XLPE insulation; insulation testing; machine insulation; partial discharges; power cable insulation; power capacitors; trees (electrical); 2500 hour; 5000 hour; MPPF capacitors; XLPE insulation; cable insulation; capacitor insulation; characteristic life; electrical trees; insulation performance; insulation resistance; inverse power law model; machine insulation; metallized polypropylene film capacitors; partial discharges; solid dielectrics; tan δ; tree length; Aging; Cable insulation; Capacitors; Coils; Dielectrics and electrical insulation; Partial discharges; Rotating machines; Solids; Stress; Trees - insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
  • Conference_Location
    Vasteras
  • Print_ISBN
    0-7803-4237-2
  • Type

    conf

  • DOI
    10.1109/ICSD.1998.709242
  • Filename
    709242