Fault diagnosis in ATE´s analog circuit modules with the aid of parameter estimation method

Author

Ker, Dershyang

Author_Institution

Chung Shan Inst. of Sci. & Technol., Lung-Tan, Taiwan

fYear

1993

fDate

18-20 May 1993

Firstpage

574

Lastpage

577

Abstract

The author presents a parameter estimation approach embedded in the host computer of automatic test equipment (ATE) for fault diagnosis of analog equipment in the time domain. The aim is to use dynamic models to enable the estimation of all components of analog circuit modules which are influenced by faults. This method provides ATEs analog circuit modules with a self-test diagnostic by aid using existing interface cards, switching units, and host computer without additional test equipment. Examples show the advantages of the proposed method implemented into an automatic test system

Keywords

analogue circuits; automatic test equipment; automatic testing; built-in self test; fault diagnosis; parameter estimation; ATE; analog circuit modules; analog equipment; automatic test equipment; dynamic models; fault diagnosis; host computer; interface cards; parameter estimation; self-test diagnostic; switching units; time domain; Analog circuits; Analog computers; Automatic test equipment; Built-in self-test; Circuit faults; Computer interfaces; Embedded computing; Fault diagnosis; Parameter estimation; Switching circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE

Conference_Location

Irvine, CA

Print_ISBN

0-7803-1229-5

Type

conf

DOI

10.1109/IMTC.1993.382577

Filename

382577