• DocumentCode
    2518631
  • Title

    VALIDATION OF A NEW OPTIMISATION ALGORITHM FOR REGISTRATION TASKS IN MEDICAL IMAGING

  • Author

    Wiest-Daesslé, Nicolas ; Prima, Sylvain ; Morrissey, Sean Patrick ; Barillot, Christian

  • Author_Institution
    INRIA, Rennes
  • fYear
    2007
  • fDate
    12-15 April 2007
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    A number of problems frequently encountered in brain image analysis can be conveniently solved within a registration framework, such as alignment of mono- or multi-sequence magnetic resonance images (MRI) for single or multiple subjects, computation of the cerebral mid-sagittal plane in anatomical or diffusion-tensor MRI, correction of acquisition distortions in diffusion-weighted MRI, etc. A widely used approach for registration tasks consists of maximising a similarity criterion between the intensities of the images to be matched. In this context, efficient optimisation methods are needed to obtain good performances. In this paper, we introduce a new optimisation algorithm (called NEWUOA) to address the above registration problems, and we demonstrate its robustness and accuracy properties
  • Keywords
    biodiffusion; biomedical MRI; brain; image matching; image registration; image sequences; medical image processing; neurophysiology; optimisation; acquisition distortion correction; anatomical MRI; brain image analysis; cerebral midsagittal plane computation; diffusion-tensor MRI; diffusion-weighted MRI; image intensity; image matching; image registration tasks; magnetic resonance images; medical imaging; monosequence images; multisequence images; new unconstrained optimisation algorithm; optimisation algorithm; similarity criterion; Biomedical imaging; Brain; Diffusion tensor imaging; Hospitals; Image analysis; Level measurement; Magnetic resonance imaging; Nervous system; Robustness; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2007. ISBI 2007. 4th IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    1-4244-0672-2
  • Electronic_ISBN
    1-4244-0672-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2007.356783
  • Filename
    4193217