Title :
1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers [Front Matter and Table of Contents]
Abstract :
Presents the front cover and table of contents from the conference proceedings.
Keywords :
analogue circuits; binary decision diagrams; circuit CAD; circuit layout CAD; circuit simulation; combinational circuits; design for testability; industrial property; logic CAD; logic simulation; sequential circuits; BDD performance; analog circuit design; analog test; circuit partitioning; circuit simulation; combinational logic synthesis; computer aided design; core based design; delay modelling; design for testability; digital systems; domino logic synthesis; dynamic system synthesis; floorplanning; functional representation; high level synthesis; intellectual property protection; interconnect optimization; interface synthesis; logic synthesis; memory; pass transistor; power estimation; reduced order modelling; sequential circuit testing; sequential verification; test generation; timing optimization;
Conference_Titel :
Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-008-2
DOI :
10.1109/ICCAD.1998.144231
