DocumentCode
2518666
Title
Array codes for clustered column erasures
Author
Cassuto, Yuval ; Bruck, Jehoshua
Author_Institution
Hitachi Global Storage Technol., San Jose, CA
fYear
2008
fDate
6-11 July 2008
Firstpage
1726
Lastpage
1730
Abstract
A new error model is proposed for codes over channels with memory. According to this error model, both the number of symbol errors and the number of error clusters are used to characterize permissible errors. Considering this model as a generalization of random erasures in array codes naturally captures the properties of high-order failure events in disk arrays. A new family of codes tailored to such a model is shown to provide significant complexity improvements compared to known array codes.
Keywords
channel coding; array codes; clustered column erasures; error clusters; high-order failure events; symbol errors; Cooling; Decoding; Error correction; Error correction codes; Hamming distance; Mechanical cables; Memoryless systems; Postal services; Power supplies; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Conference_Location
Toronto, ON
Print_ISBN
978-1-4244-2256-2
Electronic_ISBN
978-1-4244-2257-9
Type
conf
DOI
10.1109/ISIT.2008.4595283
Filename
4595283
Link To Document