Title :
Error-correcting codes for rank modulation
Author :
Jiang, Anxiao Andrew ; Schwartz, Moshe ; Bruck, Jehoshua
Author_Institution :
Comput. Sci. Dept., Texas A&M Univ., College Station, TX
Abstract :
We investigate error-correcting codes for a novel storage technology for flash memories, the rank-modulation scheme. In this scheme, a set of n cells stores information in the permutation induced by the different charge levels of the individual cells. The resulting scheme eliminates the need for discrete cell levels, overcomes overshoot errors when programming cells (a serious problem that reduces the writing speed), and mitigates the problem of asymmetric errors. In this paper, we study the properties of error correction in rank modulation codes. We show that the adjacency graph of permutations is a subgraph of a multi-dimensional array of a special size, a property that enables code designs based on Lee- metric codes. We present a one-error-correcting code whose size is at least half of the optimal size. We also present additional error-correcting codes and some related bounds.
Keywords :
error correction codes; flash memories; graph theory; modulation; Lee-metric codes; adjacency graph; asymmetric errors; error-correcting codes; flash memories; overshoot errors; permutation; rank modulation; storage technology; Computer errors; Computer science; Current measurement; Electron traps; Error correction codes; Flash memory; Modulation coding; Nonvolatile memory; Robustness; Writing;
Conference_Titel :
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-2256-2
Electronic_ISBN :
978-1-4244-2257-9
DOI :
10.1109/ISIT.2008.4595285