DocumentCode
2518740
Title
A new look at classification of transformer normal and abnormal currents
Author
Abdel-Hafez, Mohamed ; Gaouda, Ahmed M.
Author_Institution
Dept. of Electr. Eng., United Arab Emirates Univ., Al-Ain, United Arab Emirates
fYear
2010
fDate
26-28 April 2010
Firstpage
830
Lastpage
834
Abstract
The paper proposes an enhanced wavelet-based feature extraction technique to classify transformer inrush currents (TIC) and transformer internal faults (TIF). The proposed tool utilizes the number of wavelet coefficients of local maxima as current signal slides into Kaiser´s window. The general pattern of number of coefficients of local maxima at the first three resolutions are used to design a new automated tool for monitoring and classifying abnormal conditions in power transformers. The proposed monitoring technique is evaluated using large data sets.
Keywords
fault diagnosis; feature extraction; power transformers; wavelet transforms; Kaiser window; automated tool; transformer inrush currents; transformer internal faults; transformer normal-abnormal currents; wavelet-based feature extraction technique; Circuit faults; Current transformers; Energy resolution; Monitoring; Power transformers; Signal processing; Signal resolution; Surges; Transformer cores; Wavelet transforms; Inrush current; Kaiser´s Window; Multi-resolution analysis; Transformer Faults; Wavelet transform.;
fLanguage
English
Publisher
ieee
Conference_Titel
MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference
Conference_Location
Valletta
Print_ISBN
978-1-4244-5793-9
Type
conf
DOI
10.1109/MELCON.2010.5475955
Filename
5475955
Link To Document