DocumentCode :
2518740
Title :
A new look at classification of transformer normal and abnormal currents
Author :
Abdel-Hafez, Mohamed ; Gaouda, Ahmed M.
Author_Institution :
Dept. of Electr. Eng., United Arab Emirates Univ., Al-Ain, United Arab Emirates
fYear :
2010
fDate :
26-28 April 2010
Firstpage :
830
Lastpage :
834
Abstract :
The paper proposes an enhanced wavelet-based feature extraction technique to classify transformer inrush currents (TIC) and transformer internal faults (TIF). The proposed tool utilizes the number of wavelet coefficients of local maxima as current signal slides into Kaiser´s window. The general pattern of number of coefficients of local maxima at the first three resolutions are used to design a new automated tool for monitoring and classifying abnormal conditions in power transformers. The proposed monitoring technique is evaluated using large data sets.
Keywords :
fault diagnosis; feature extraction; power transformers; wavelet transforms; Kaiser window; automated tool; transformer inrush currents; transformer internal faults; transformer normal-abnormal currents; wavelet-based feature extraction technique; Circuit faults; Current transformers; Energy resolution; Monitoring; Power transformers; Signal processing; Signal resolution; Surges; Transformer cores; Wavelet transforms; Inrush current; Kaiser´s Window; Multi-resolution analysis; Transformer Faults; Wavelet transform.;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference
Conference_Location :
Valletta
Print_ISBN :
978-1-4244-5793-9
Type :
conf
DOI :
10.1109/MELCON.2010.5475955
Filename :
5475955
Link To Document :
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