• DocumentCode
    2518740
  • Title

    A new look at classification of transformer normal and abnormal currents

  • Author

    Abdel-Hafez, Mohamed ; Gaouda, Ahmed M.

  • Author_Institution
    Dept. of Electr. Eng., United Arab Emirates Univ., Al-Ain, United Arab Emirates
  • fYear
    2010
  • fDate
    26-28 April 2010
  • Firstpage
    830
  • Lastpage
    834
  • Abstract
    The paper proposes an enhanced wavelet-based feature extraction technique to classify transformer inrush currents (TIC) and transformer internal faults (TIF). The proposed tool utilizes the number of wavelet coefficients of local maxima as current signal slides into Kaiser´s window. The general pattern of number of coefficients of local maxima at the first three resolutions are used to design a new automated tool for monitoring and classifying abnormal conditions in power transformers. The proposed monitoring technique is evaluated using large data sets.
  • Keywords
    fault diagnosis; feature extraction; power transformers; wavelet transforms; Kaiser window; automated tool; transformer inrush currents; transformer internal faults; transformer normal-abnormal currents; wavelet-based feature extraction technique; Circuit faults; Current transformers; Energy resolution; Monitoring; Power transformers; Signal processing; Signal resolution; Surges; Transformer cores; Wavelet transforms; Inrush current; Kaiser´s Window; Multi-resolution analysis; Transformer Faults; Wavelet transform.;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference
  • Conference_Location
    Valletta
  • Print_ISBN
    978-1-4244-5793-9
  • Type

    conf

  • DOI
    10.1109/MELCON.2010.5475955
  • Filename
    5475955