Title :
A coloring approach to the structural diagnosis of interconnects
Author :
Chen, X.T. ; Lombardi, F.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
This paper presents a new approach for diagnosing stuck-at and short faults in interconnects whose layouts are known. This structural approach exploits different graph coloring and coding techniques to generate a test set with no aliasing and confounding. The conditions for aliasing and confounding are analyzed with respect to the size and number of the shorts in the fault set. The characteristics of unbalanced/balanced codes for encoding the colors in the vector generation process for interconnect diagnosis are discussed and proved using a novel algebra. An algorithm for diagnosis is then presented.
Keywords :
circuit layout CAD; fault diagnosis; graph colouring; graph theory; integrated circuit interconnections; integrated circuit layout; integrated circuit testing; aliasing; balanced codes; coding techniques; confounding; graph coloring; interconnect layouts; interconnect structural diagnosis; short fault diagnosis; stuck-at fault diagnosis; test set generation; unbalanced codes; vector generation process; Algebra; Bridges; Character generation; Circuit faults; Color; Encoding; Fault diagnosis; Integrated circuit interconnections; Manufacturing; Testing;
Conference_Titel :
Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-7597-7
DOI :
10.1109/ICCAD.1996.571354
