DocumentCode
2518808
Title
Nondestructive microwave measurements of dielectric materials
Author
Ganchev, Stoyan I.
Author_Institution
Hewlett-Packard Co., Colorado Springs, CO, USA
Volume
3
fYear
1998
fDate
20-22 May 1998
Firstpage
687
Abstract
Nondestructive microwave dielectric measurements based on open-ended rectangular waveguide and coaxial line sensors are considered. The errors in the dielectric constant measurements due to the uncertainties of the measuring instruments are calculated and compared for the two types of sensors. A comparison based on advantages and disadvantages for both sensors is also presented
Keywords
dielectric measurement; microwave measurement; nondestructive testing; rectangular waveguides; coaxial line sensors; dielectric constant measurements; dielectric materials; dielectric measurements; measuring instruments; nondestructive microwave measurements; open-ended rectangular waveguide; Dielectric constant; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Dielectric substrates; Dielectric thin films; Measurement techniques; Measurement uncertainty; Microwave measurements; Reflection;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves and Radar, 1998. MIKON '98., 12th International Conference on
Conference_Location
Krakow
Print_ISBN
83-906662-0-0
Type
conf
DOI
10.1109/MIKON.1998.742804
Filename
742804
Link To Document