Title :
A Palm theory approach to error exponents
Author :
Anantharam, Venkat ; Baccelli, Francois
Author_Institution :
Dept. of EECS, Univ. of California, Berkeley, CA
Abstract :
We define a class of problems in the theory of Euclidean point processes, motivated by the study of the error exponent (reliability function) for additive noise channels. For the case of Gaussian noise this gives an interesting perspective on the Poltyrev exponent. It also suggests an approach to attack the long standing gap between the best known upper and lower bounds on the reliability function of the traditional AWGN channel, using techniques from point process theory.
Keywords :
AWGN channels; Gaussian noise; Euclidean point processes; Gaussian noise; Poltyrev exponent; additive noise channels; error exponents; palm theory; point process theory; reliability function; AWGN channels; Additive noise; Decoding; Error probability; Gaussian noise; Helium; Information theory; Reliability theory; Signal to noise ratio; Space stations;
Conference_Titel :
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-2256-2
Electronic_ISBN :
978-1-4244-2257-9
DOI :
10.1109/ISIT.2008.4595292