Title :
Estimation of technological losses of manufacture of the serial products of low signal transistor amplifiers realized on criterion of the bilateral matching
Author :
Vilmitsky, D.S. ; Likhanov, D.Y. ; Likhanov, Y.M. ; Friedman, Y.A.
Author_Institution :
Novosibirsk State Tech. Univ., Russia
Abstract :
The results of researches of low. signal transistor amplifiers realized by criterion of bilateral matching in view of constructive-technological scatters are discussed.
Keywords :
equivalent circuits; feedback amplifiers; impedance matching; losses; bilateral matching; constructive-technological scatters; low signal transistor amplifiers; serial products; technological losses; Active noise reduction; Frequency; Impedance matching; Indium phosphide; Manufacturing; Noise level; Scattering; Signal design; Time of arrival estimation; Voltage control;
Conference_Titel :
Electronic Instrument Engineering Proceedings, 2002. APEIE 2002. 2002 6th International Conference on Actual Problems of
Print_ISBN :
0-7803-7361-8
DOI :
10.1109/APEIE.2002.1075786
