Title :
An accurate determination of the characteristic impedance matrix of coupled symmetrical lines on chips based on high frequency S-parameter measurements
Author :
Winkel, T.-M. ; Dutta, L.S. ; Grabinski, H.
Author_Institution :
IBM, Boblingen, Germany
Abstract :
A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
Keywords :
S-parameters; electric impedance; electric impedance measurement; high-frequency transmission line measurement; transmission line matrix methods; characteristic impedance matrix; chip; high frequency S-parameter measurement; symmetric coupled lossy two line system; Calibration; Frequency measurement; Impedance; Probes; Propagation constant; Scattering parameters; Semiconductor device measurement; Silicon; Symmetric matrices; Transmission line matrix methods;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.596862
