• DocumentCode
    2519085
  • Title

    System approach to electrical measurements

  • Author

    Barwicz, A.

  • Author_Institution
    Dept. di´ingenierie, Univ. du Quebec a Trois-Rivieres
  • fYear
    1993
  • fDate
    18-20 May 1993
  • Firstpage
    397
  • Lastpage
    402
  • Abstract
    A system approach is outlined and applied to electrical measurements. The essential idea of the system approach to electrical measurements is uniform treatment of measurement problems and/or instruments, which can be considered as special cases of a system whose functions are performed via signal processing. The notions of measuring system, its calibration and measurand reconstruction are interpreted on the basis of this approach. A design methodology and selected problems of applying VLSI technology to measuring system design are discussed
  • Keywords
    VLSI; calibration; measurement theory; signal processing; VLSI technology; calibration; design methodology; electrical measurements; measurand reconstruction; system design; Biomedical signal processing; Electric variables measurement; Information systems; Instruments; Manufacturing processes; Microelectronics; Particle measurements; Signal processing; Signal processing algorithms; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
  • Conference_Location
    Irvine, CA
  • Print_ISBN
    0-7803-1229-5
  • Type

    conf

  • DOI
    10.1109/IMTC.1993.382610
  • Filename
    382610
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2519085