Title :
Extension of digital test system data rates to the gigabit per second range
Author :
Wenzel, Robert J. ; Keezer, David C.
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
Abstract :
A high frequency system and methodology are presented for the generation and capture of gigabit per second digital data. The approach extends the useful data rate of existing test systems by multiplexing channels, thereby allowing a trade-off between data rate and signal count. This capability facilitates the test of advanced bipolar emitter-coupled-logic (ECL) and GaAs digital devices using commercially available instrumentation. As an example, a GaAs-based data rate extender module is introduced which provides an interface between Gbps-range devices and a 200 Mbps host test system
Keywords :
III-V semiconductors; automatic test equipment; bipolar logic circuits; calibration; digital instrumentation; emitter-coupled logic; gallium arsenide; logic testing; microcomputer applications; multiplexing equipment; semiconductor device testing; 200 Mbit/s; GaAs digital devices; bipolar emitter-coupled-logic; digital test system data rates; high frequency system; multiplexing channels; Circuit testing; Clocks; Electronics packaging; Flip-flops; Gallium arsenide; Microelectronics; Multiplexing; Switches; System testing; Timing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
DOI :
10.1109/IMTC.1993.382625
