Title :
An Ultra-Low-Voltage 160 MS/s 7 Bit Interpolated Pipeline ADC Using Dynamic Amplifiers
Author :
Lin, James ; Paik, Daehwa ; Seungjong Lee ; Miyahara, Masaya ; Matsuzawa, Akira
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
This paper presents a 0.55 V, 7 bit, 160 MS/s pipeline ADC using dynamic amplifiers. In this ADC, high-speed open-loop dynamic amplifiers with a common-mode detection technique are used as residue amplifiers to increase the ADC´s speed, to enhance the robustness against supply voltage scaling, and to realize clock-scalable power consumption. To mitigate the absolute gain constraint of the residue amplifiers in a pipeline ADC, the interpolated pipeline architecture is employed to shift the gain requirement from absolute to relative accuracy. To show the new requirements of the residue amplifiers, the effects of gain mismatch and nonlinearity of the dynamic amplifiers are analyzed. The 7 bit prototype ADC fabricated in 90 nm CMOS demonstrates an ENOB of 6.0 bits at a conversion rate of 160 MS/s with an input close to the Nyquist frequency. At this conversion rate, it consumes 2.43 mW from a 0.55 V supply. The resulting FoM of the ADC is 240 fJ/conversion-step.
Keywords :
CMOS digital integrated circuits; amplifiers; analogue-digital conversion; low-power electronics; ADC speed; CMOS; Nyquist frequency; absolute gain constraint mitigation; clock-scalable power consumption; common-mode detection technique; dynamic amplifier nonlinearity; gain mismatch; high-speed open-loop dynamic amplifiers; power 2.43 mW; residue amplifiers; robustness enhancement; size 90 nm; supply voltage scaling; ultralow-voltage interpolated pipeline ADC; voltage 0.55 V; word length 7 bit; Accuracy; Capacitors; Clocks; Interpolation; Pipelines; Redundancy; Threshold voltage; Analog-to-digital converter; capacitive interpolation; charge-steering; clock-scalable; dual-residue; dynamic amplifier; interpolated pipeline; ultra-low-voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2015.2415472