Title :
Damage Mechanics Model for Interface Fracture Process in Solder Interconnects
Author :
Nor, Fethma M. ; Keat, Loh Wei ; Kamsah, Nazri ; Tamin, Mohd Nasir
Author_Institution :
Comput. Solid Mech. Lab. (CSMLab), Univ. Teknol. Malaysia, Skudai, Malaysia
Abstract :
In this study, cohesive damage zone model is evaluated and employed to model solder/intermetallics (IMC) interface crack initiation and propagation in solder interconnects. Interface materials damage is quantified in terms of stress-to-strength ratios of orthogonal components in a quadratic failure criterion along with a mixed-mode displacement formulation for crack initiation event. Subsequent crack propagation is predicted based on fracture energy considerations. The mechanics of solder/IMC interface decohesion is examined through finite element modeling of a typical solder ball shear test. The 3D model consists of Sn40Pb solder, Ni3Sn4 intermetallics and Ni layers, copper substrate and a rigid shear tool. Unified inelastic strain theory describes the strain rate- and temperature-dependent response of the solder. The strength and work of fracture of the bi-material interface are derived from load-displacement data of solder ball pull tests and ball shear tests. The quasi-static solder ball shear test of reflowed solder sample is simulated at 30°C with a prescribed displacement rate of 0.01 mm/sec. Results show that complex stresses developed on the interface plane due to applied shear and induced bending effects by the shear tool clearance. A nonlinear damage evolution is predicted at each interface material point during the test. Stresses in the "fractured" material points diminish as the crack front progresses. The progression of damage indicates a straight crack front for the brittle solder/IMC interface fracture, as observed experimentally. The corresponding fractographic analysis on the sheared interface indicates that the crack initiated and propagated along the bi-material solder/IMC interface.
Keywords :
bending; brittle fracture; cracks; finite element analysis; fractography; fracture toughness; integrated circuit interconnections; lead alloys; mechanical testing; nickel; nickel alloys; reflow soldering; solders; surface mount technology; tin alloys; 3D model; Cu; Sn40Pb solder; SnPb-Ni3Sn4-Ni; bending; bimaterial solder-intermetallic interface; brittle fracture; cohesive damage zone model; copper substrate; crack initiation; crack propagation; damage mechanics model; finite element modeling; fractographic analysis; fracture energy; fracture strength; fracture work; interface decohesion; interface fracture process; load-displacement property; mixed-mode displacement formulation; nickel layer; quadratic failure criterion; quasistatic solder ball shear test; reflowed solder; rigid shear tool; solder ball pull test; solder interconnects; solder joint metallurgy; strain rate; stress-strength ratio; surface mount microelectronic component reliability; temperature 30 degC; unified inelastic strain theory; Adhesives; Capacitive sensors; Computer interfaces; Intermetallic; Laboratories; Mechanical engineering; Soldering; Solid modeling; Testing; Thermal stresses;
Conference_Titel :
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2117-6
Electronic_ISBN :
978-1-4244-2118-3
DOI :
10.1109/EPTC.2008.4763533